Please use this identifier to cite or link to this item: http://repository.futminna.edu.ng:8080/jspui/handle/123456789/15349
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dc.contributor.authorOGUNJIDE, SUNDAY-
dc.contributor.authorUSMAN, ABRAHAM USMAN-
dc.contributor.authorOHIZE, HENRY OHIANI-
dc.contributor.authorDAUDA, UMAR SULEIMAN-
dc.date.accessioned2022-12-14T12:16:36Z-
dc.date.available2022-12-14T12:16:36Z-
dc.date.issued2018-10-17-
dc.identifier.urihttp://repository.futminna.edu.ng:8080/jspui/handle/123456789/15349-
dc.description.abstractWireless propagation modeling is an essential task in planning wireless networks. In the last few decades, the use of Wireless Local Area Network (WLAN) popularly referred to as Wi-Fi(Wireless Fidelity) in communication system has been on the increase with the exponential usage of handheld cell phones, laptops, and palm-tops to mention but a few. Notwithstanding, WLAN faces a peculiar propagation issue which lies in its changing propagation environment and this affects the quality of service. Poor quality of service is experienced on WLAN of GidanKwano campus of Federal university of technology, Minna. This arises due to signal propagation impairment caused by the terrain and the structures within the campus. Received Signal Strength (RSS) measurements were conducted at different locations away from the selected Access Points (APs) both in Line of Sight (LOS) and Non- Line of Sight (NLOS) situations. The path loss exponent (n) and standard deviation (σ) were estimated for the environment. The obtained results were contrasted with the already published work to show the level of agreement. The empirical models were developed for LOS and NLOS situations and compared with the existing standard models.en_US
dc.language.isoenen_US
dc.publisherABU ZARIAen_US
dc.subjectWireless Local Area Network, Path loss model, Path loss exponent, Propagation impairment, Access Points (APs)en_US
dc.titleDevelopment of a Propagation Model for IEEE 802.11 Wireless Networks: Case of Gidan Kwano Campus, FUT MINNAen_US
dc.typeArticleen_US
Appears in Collections:Electrical/Electronic Engineering

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