Please use this identifier to cite or link to this item: http://repository.futminna.edu.ng:8080/jspui/handle/123456789/1100
Full metadata record
DC FieldValueLanguage
dc.contributor.authorAgbonoga, E. A-
dc.contributor.authorAdedipe, Oyewole-
dc.contributor.authorOkoro, U.G-
dc.contributor.authorUsman, F.J-
dc.contributor.authorObanimomo, K.T-
dc.contributor.authorLawal, Sunday Albert-
dc.date.accessioned2021-06-03T20:43:31Z-
dc.date.available2021-06-03T20:43:31Z-
dc.date.issued2020-
dc.identifier.urihttp://repository.futminna.edu.ng:8080/jspui/handle/123456789/1100-
dc.description.abstractThis study investigated the effects of process parameters of plasma arc cutting (PAC) of low carbon steel material using analysis of variance. Three process parameters, cutting speed, cutting current and gas pressure were considered and experiments were conducted based on response surface methodology (RSM) via the box-Behnken approach. Process responses viz. surface roughness (Ra) and kerf width of cut surface were measured for each experimental run. Analysis of Variance (ANOVA) was performed to get the contribution of process parameters on responses. Cutting current has the most significant effect of 33.43% on the surface roughness and gas pressure has the most significant effect on kerf width of 41.99%. For minimum surface roughness and minimum kerf width, process parameters were optimized using the RSMen_US
dc.language.isoenen_US
dc.publisherFUOYE Journal of Engineering and Technologyen_US
dc.relation.ispartofseries;5(1)-
dc.subjectCutting speed,en_US
dc.subjectcutting current,en_US
dc.subjectgas pressure,en_US
dc.subjectsurface roughness,en_US
dc.subjectkerf widthen_US
dc.titleEffect of Process Parameters on the Surface Roughness and Kerf Width of Mild Steel during Plasma Arc Cutting Using Response Surface Methodologyen_US
dc.typeArticleen_US
Appears in Collections:Mechanical Engineering

Files in This Item:
File Description SizeFormat 
Keft.pdf557.69 kBAdobe PDFView/Open


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.